FIB grid holders and FIB grid and specimen holders
The Micro to Nano range of holders is designed to hold FIB grids and provide easy access to posts on the FIB grids to attach FIB lift-out lamellae. FIB grid holders can be used in FIB/SEM systems, but also for safe storage of FIB grids with attached lamellae.
The combined FIB grid holder and specimen holders hold FIB grids directly alongside a standard SEM pin stub with a specimen. Lift-out lamellae only need to be moved over a short distance to attach them to FIB grids.
EM-Tec FIB grid holders from are all precision machined from vacuum grade aluminium.
Available on a standard pin, short Zeiss pin or with an M4 Hitachi thread.
Also available for t-EBSD applications
EM-Tec FIB grid and specimen holders on a standard pin
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EM-Tec F12 compact FIB grid holder for up to two FIB grids - pin (each). A practical FIB grid holder with a pin for two FIB grids. Based on the standard Ø12.7mm pin stub, it is compact and useful for storing valuable FIB specimens. The 10mm wide vice clamp includes a ledge for easy positioning of FIB grids |
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EM-Tec F25 FIB grid holder for up to fie FIB grids - pin (each). The EM-Tec F25 is a larger FIB grid holder with a pin which can accommodate up to four FIB grids of the same thickness. The 25mm wide vice includes a ledge for easy positioning of FIB grids and two brass thumb screws to operate the vice. |
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EM-Tec FS25 FIB grid and specimen holder for up to five FIB grids and Ø25.4mm pin stub - pin (each). The EM-Tec FS25 combines the wider F25 FIB grid holder vice with a holder for Ø25.4mm pin stubs in a single, compact holder with a standard pin. This provides a single loading cycle for FIB grids and specimens and short distances from lift-out to lamellae mounting. The wafer-type specimen surface is at the same height as the FIB grid posts. |
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EM-Tec FS21 FIB grid and specimen holder for up to two FIB grids and Ø12.7mm pin stub - pin (each). EM-Tec FS21 combines the EM-Tec F12Z FIB grid holder with two standard 12.7mm (1/2") pin stubs. The F12 FIB grid holder and the specimen stubs can be rotated in the holder for selecting the optimum orientation in the FIB/SEM. The EM-Tec FS21 FIB grid holder enables loading specimens and FIB grids at the same location. The FIB grid and the specimen stubs are at the same level when using Si wafer specimens. Includes 1 x EM-Tec F12Z and 2 x standard 12.7mm pin stubs. |
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EM-Tec FS22 FIB grid and specimen holder for up to 2 x 2 FIB grids and 2 x Ø12.7mm pin stub - pin (each). EM-Tec FS22 combines two F12 FIB grid holders with two standard 12.7mm (1/2") pin stubs within a 27 x 27mm footprint. Both F12 FIB grid holders and pin stubs can be rotated independently in the holder for selecting the optimum orientation in the FIB/SEM. The EM-Tec FS22 dual FIB grid and specimen holder enables loading both the specimen and FIB grids close together. The FIB grid and the specimen stubs are at the same level when using Si wafer specimens. |
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EM-Tec FIB grid and specimen holders on a short Zeiss pin
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EM-Tec F12Z compact FIB grid holder for up to 2 FIB grids - short Zeiss pin (each). EM-Tec F12Z has a pin for two FIB grids. Based on the standard Ø12.7mm pin stub, but with a shorter Zeiss pin - it is compact and useful for storing valuable FIB specimens. The 10mm wide vice clamp includes a ledge for easy positioning of FIB grids. |
EM-Tec FIB grid and specimen holders with an M4 Hitachi thread
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EM-Tec F25 FIB grid holder for up to five FIB grids - M4 (each). The EM-Tec F25 is a larger FIB grid holder with a M4 threaded hole which can accommodate up to four FIB grids of the same thickness. The 25mm wide vice includes a ledge for easy-positioning of FIB grids and two brass thumb screws to operate the vice. |
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EM-Tec FS25 FIB grid and specimen holder for up to five FIB grids and Ø25.4mm pin stubs - M4 (each). The EM-Tec FS25 combines the wider F25 FIB grid holder vice with a holder for Ø25.4mm pin stubs in a single, compact holder with an M4 thread. This provides a single loading cycle for FIB grids and specimens and short distances from lift-out to lamellae mounting. For wafer-type specimens, the surface is at the same height as the FIB grid posts. |
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EM-Tec FS21 FIB grid and specimen holder for up to two FIB grids and Ø12.7mm pin stub - M4 (each). The EM-Tec FS21 combines a EM-Tec F12 FIB grid holder with two standard 12.7mm (1/2") pin stubs. The F12 FIB grid holder and the specimen stubs can be rotated in the holder for selecting the optimum orientation in the FIB/SEM. The EM-Tec FS21 FIB grid and specimen holder enables loading the specimens and FIB grids close together. The FIB grid and specimen stubs are at the same level when using Si wafer specimens. Includes 1 x EM-Tec F12Z and 2 x standard 12.7mm pin stubs. |
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EM-Tec FS22 FIB grid and specimen holder for up to 2 x 2 FIB grids and 2 x Ø12.7mm pin stub - M4 Hitachi thread (each). EM-Tec FS22 combines two F12 FIB grid holders with two standard 12.7mm (1/2") pin stubs within a 27 x 27mm footprint. Both F12 FIB grid holders and pin stubs can be rotated independently in the holder for selecting the optimum orientation in a FIB/SEM. The EM-Tec FS22 dual FIB grid and specimen holder enables loading the specimens and FIB grids close together. The FIB grid and the specimen stubs are at the same level when using Si wafer specimens. |
EM-Tec FIB grid holders for t-EBSD
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