FIB pre-tilt stub holders
Micro to Nano pre-tilt stub holders are useful for FIB-SEM systems to get the specimen perpendicular with the FIB column to allow for straight FIB milling in to the surface of the specimen. The pre-tilt angles are complementary to the angles between the FIB column and the electron beam column. Using pre-tilt stub holders there is no need to tilt the specimen stage.
Three types are available:
- EM-Tec P38 fixed 38° tilt holder for FEI pin stubs. Used to pre-tilt specimens 38° for FEI Dual Beam FIB systems. Size w.o. pin is Ø12.7x17mm.
- EM-Tec P36 fixed angle 36° tilt holder for Zeiss pin stubs. Used to pre-tilt specimens 36° for Zeiss CrossBeam FIB systems. Size w.o. pin is Ø12.7x17mm.
- EM-Tec P35 fixed angle 35° tilt holder for standard and Tescan pin stubs. Used to pre-tilt specimens 35° for Tescan FIBxSEM systems. Size w.o. pin is Ø12.7x17mm.
Product # |
Style |
Angle |
FIB-SEM |
Capacity |
Size w/o pin |
Stub holding method |
10-002238 |
P38 |
38° |
Thermo/FEI |
Ø3.2mm pin |
Ø12.7x17mm |
Set screw |
10-002236 |
P36 |
36° |
Zeiss |
Ø3.2mm pin |
Ø12.7x17mm |
Set screw |
10-002235 |
P35 |
35° |
Tescan |
Ø3.2mm pin |
Ø12.7x17mm |
Set screw |
Qty
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Qty
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Qty
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pre tilt holders, FIB holders