Special offer - Delivery now £4.99 when ordered onlineLow profile stubs for FIB and FIB-SEM applications
Micrto to Nano low profile pin stubs have been especially developed for FIB-SEM applications to bring specimens closer to the pole piece of FIB-SEM systems to enable low working distances. They are available as flat, vertical and complementary tilt versions of the standard Ø12.7mm pin stub. The complimentary tilt version allow positioning of the specimen surface flat under the FIB column without the need to tilt the stage. The tilt angle is relative to the vertical electron beam column of the FIB/SEM. Stubs are made from vacuum grade aluminium and they are fully compatible with standard pin stubs for storage and handling.
Available in the following types:
- Low profile, flat, horizontal pin mount with standard or short pin
- Low profile, 90°, vertical pin mount with standard or short pin
- 38° complimentary angle pin mount for FEI DualBeam and FIB/SEMs
- 36° complimentary angle pin mount for Zeiss CrossBeam and FIB/SEMs
- 35° complimentary angle pin mount for Tescan Lyra and VELA FIBxSEMs
|
Product |
Angle |
FIB-SEM |
Diameter |
Standard Pin |
Short Pin |
Grooved side |
|
10-002112 |
0° |
FEI, Tescan |
Ø12.7mm |
V |
- |
- |
|
10-002114 |
90° |
FEI, Tescan |
Ø12.7mm |
V |
- |
V |
|
10-002115 |
35° |
Tescan |
Ø12.7mm |
V |
- |
V |
|
10-002118 |
38° |
FEI, Tescan |
Ø12.7mm |
V |
- |
V |
|
10-003112 |
0° |
Zeiss |
Ø12.7mm |
- |
V |
- |
|
10-003114 |
90° |
Zeiss |
Ø12.7mm |
- |
V |
V |
|
10-003116 |
36° |
Zeiss |
Ø12.7mm |
- |
V |
V |
Low profile pin stubs for FEI and/or Tescan FIB/SEM systems
Low profile short pin stubs for Zeiss FIB/SEM systems
