Lumis EBSD Detector
The ThermoFisher Scientific™ Lumis electron backscatter detection (EBSD) rapidly identifies crystallographic phases, grain sizes and orientation and monitors structural transformations in scanning electron microscope (SEM) samples. Lumis is designed for maximum throughput and high resolution. The Lumis EBSD detector uses the latest CMOS sensor technology and advanced optics harnessed with Pathfinder 2.0 microanalysis software that includes advanced indexing algorithms for the analysis of electron backscatter patterns (EBSPs)
High speed detection
The Lumis EBSD detector features the most developed CMOS sensor technology available. It has advanced optics and accelerating indexing algorithms for the analysis of electron backscatter patterns (EBSPs) using probe currents down to 10 pA and below. The Lumis detector has pattern collection at >2.2 million pixels and is ideally suited to HR-EBSD strain measurement and phase identification applications.
Using optical and sensor binning, the detector can be optimised for high speed EBSD at several thousand frames per second for reduced collection times and higher sample throughputs. With advanced optics and high sensor sensitivity Lumis allows EBSPs to be acquired at ultra-low probe currents below 10 pA. This is particularly important for beam sensitive and dose restricted materials - or in cases where higher probe current may introduce contamination or drift.
A large format CMOS sensor and a patented reverse zoom optic to complement and extend the built-in CMOS sensor binning. A high efficiency, octagonal scintillator converts the electron backscatter electrons into light, which is focused on to a user-controlled region of the sensor by the high-quality reverse zoom optic. This allows a continuous choice of "binned" EBSP size and gives full flexibility over EBSP speed, quality and sensitivity.
Brochure: Lumis EBDS brochure
Scientific poster: Metals Characterization by Principal Component EDS Analysis and EBSD