Special offer - Delivery now £4.99 when ordered onlineEM-Tec EDX-Checker for EDX systems and BSE detectors
The EM-Tec EDX-Checker has been developed as a cost-efficient tool for quick and easy checking of calibration, performance, and resolution of an EDX system on an SEM. Regular use of the EDX-Checker ensures optimum performance of the EDX detector. The EM-Tec EDX-Checker consists of a standard aluminium SEM pin stub with Ni grids and the reference materials C, PTFE, Mn, Co, AISI 316L and Al/Cu embedded in a vacuum compatible epoxy resin. The EDX-Checker is polished down to 0.5um and coated with carbon. The additional boron nitride is not carbon coated.
The EM-Tec EDX-Checker features:
- Quick and easy EDX calibration and performance check
- Ideal for EDX systems from EDAX, Thermo, Bruker, Oxford Instruments, IXRF, Phenom and JEOL
- Polished surface – no topography artefacts with the reference materials
- Available in two versions
- Known and consistent take-off angle due to polished surface
- Hexagonal white BN does not need conductive carbon coating
- Low magnification image and X-ray mapping calibration
- Compact and cost effective
- Available as a pin stub and with adaptors for JEOL and Hitachi SEMs
The EM-Tec EDX-Checker is available in two versions for all brands of SEM:
- EDX-Checker S-7 with C, PTFE, Mn, Co and Al/Cu as reference materials and Ni grids with 400 plus 1000 mesh for quick magnification, calibration and mapping check. Ideally suited for table top SEMs with EDS.
- EDX-Checker S8 with C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check. Ideally suited for table top SEMs with EDS.
- EDX-Checker LE-10 with BN, C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and a 400 mesh nickel grid for quick magnification calibration and mapping check. Optimised for low element performance checking.
EDX-Checker with Hitachi M4 adaptor. EDX-Checker with JEOL Ø25mm adaptor. EDX-Checker with pin stored in tube.
Purpose of reference materials in the EM-Tec EDX-Checker:
|
Materials |
Purpose of reference material |
S-7 |
S-8 |
LE-10 |
|
C |
Light element EDX detector performance test for carbon |
X |
X |
X |
|
BN |
Light element EDX detector performance test for boron and nitrogen |
|
X |
|
|
PTFE |
Light element test and resolution for fluorine |
X |
X |
X |
|
Al/Cu |
EDX system calibration with aluminium and copper peaks |
X |
X |
X |
|
Mn |
EDX-detector resolution check for Mn Kα Peak |
X |
X |
X |
|
Co |
EDX-detector resolution check and linearity |
X |
X |
X |
|
AISI 316L |
Quantitative analysis check |
|
X |
X |
|
400 mesh Ni |
Quick magnification check / mapping |
X |
X |
X |
|
1000 mesh Ni |
Quick magnification check / mapping |
X |
X |
EDX-Checker S-7 EDX-Checker S-8 with 316L EM-Tec EDX-Checker LE-10 with light elements
Ordering information
EM-Tec EDX-Checker S-7 with C, PTFE, Mn, Al/Cu, Co and 400/1000 mesh Ni grids.
EDX-Checker S-7 with C, PTFE, Mn, Co and Al/Cu as reference materials and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check.
EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al/Cu, Co, AISI 316L and 400/1000 mesh Ni grids.
EDX-Checker S8 with C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis checking and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping checking.
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Qty
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 EM-Tec EDX-Checker S-8 with Hitachi M4 adaptor for standard aluminium pin stub (each) |
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EM-Tec EDX-Checker S-8 with Ø25 x 10mm JEOL adaptor for standard aluminium pin stub (each) |
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EM-Tec EDX-Checker LE-10 with BN, C, PTFE, Mn, Al/Cu, Co, AISI 316L and 400mesh Ni grid.
EDX-Checker LE-10 with BN, C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and a 400mesh Nickel grid for quick magnification calibration and mapping checking.
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Qty
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 EM-Tec EDX-Checker LE-10 with Hitachi M4 adaptor for standard aluminium pin stub (each) |
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Qty
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EM-Tec EDX-Checker LE-10 with Ø 25 x 10mm JEOL adaptor for standard aluminium pin stub (each) |
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Qty
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EM-Tec EDX-Checker LE-10, Ø12.7mm standard aluminium pin stub (each) |